Аннотация: The article considers an information approach to testing digital integrated circuits (DIC) and presents an entropy criterion that allows reducing the length of the test during pseudo-random DIC testing. A random search method was used to optimize the probability distribution of the signals supplied to the CIS inputs. In the course of the research, fault control tests such as "breakage" and "short circuit" were built. The research results suggest that the length of the tests based on the presented criterion does not differ from the tests obtained by other methods